@Article{SouzaCastNonoSiqu:2008:StZrCe,
               author = "Souza, Jos{\'e} Vitor C. and Castro, Pedro Jos{\'e} de and Nono, 
                         Maria do Carmo A. and Siqueira, Anderson R.",
          affiliation = "{Instituto Nacional de Pesquisas Espaciais (INPE)} and {Instituto 
                         Nacional de Pesquisas Espaciais (INPE)} and {Instituto Nacional de 
                         Pesquisas Espaciais (INPE)}",
                title = "Study of ZrO2-TiO2 Ceramics with SnO, SrO and Nb2O5 Additives for 
                         Dielectric Resonator Application",
              journal = "Materials Science Forum. Advanced Powder Technology VI Book 
                         Series",
                 year = "2008",
               volume = "591-93",
                pages = "381--386",
             keywords = "Dielectric Resonators, ZrO2-TiO2 ceramics, Ceramic 
                         microstructure.",
             abstract = "This paper presents a systematic study about ceramics made of 
                         zirconium oxide and titanium oxide (ZrO2-TiO2) doped with tin 
                         oxide (SnO2), strontium oxide (SrO2) and niobium oxide (Nb2O5). 
                         These ceramics can be applied as dielectric resonators in 
                         microwave systems for telecommunications. For a good microwave 
                         performance, these ceramics must reach some parameter values as 
                         high dielectric constant and high quality factor due to the 
                         dielectric losses. The ceramics were manufactured using suitable 
                         powder mixtures of ZrO2-TiO2 with additions of 1 % of SnO2, SrO2 
                         and Nb2O5, resulting in four different kinds of samples for 
                         analysis. The samples were compacted by an uniaxial (190 MPa) and 
                         an isostatic (300 MPa) pressing, sintered at 1200 °C for 3 hours, 
                         characterized in the chemical compound formation using X-ray 
                         Diffraction (XRD) and scanned for microstructure densification 
                         degree and grain distribution analysis in Scanning Electron 
                         Microscopy (SEM). The dielectric parameters were measured using a 
                         microwave system. The main goal of present procedure is 
                         manufacture ceramic materials for promising application as 
                         dielectric resonators.",
                  doi = "10.4028/www.scientific.net/MSF.591-593.381",
                  url = "http://dx.doi.org/10.4028/www.scientific.net/MSF.591-593.381",
                label = "lattes: 6241846354545180 2 SouzaCastNonoSiqu:2008:StZrCe",
             language = "en",
                  url = "http://www.scientific.net",
        urlaccessdate = "05 maio 2024"
}